A two-day workshop focusing on X-ray Photoelectron Spectroscopy (XPS), arguably the most widely used surface analytical technique.
Date(s): April 27, 2009 (Monday) to April 28, 2009 (Tuesday)
Time: 9:00 AM to 5:00 PM
Location: University of Oregon, Eugene, Oregon
A two-day workshop focusing on X-ray Photoelectron Spectroscopy (XPS), arguably the most widely used surface analytical technique. The presentations will be appropriate both for researchers new to XPS and for those with significant experience with the technique. Thematic emphases will be on quantitative aspects of XPS analysis and analytical issues particular to nanoscale materials, as well as the importance of multi-technique analysis.
The workshop will include instrument demonstrations and a tutorial on using Sven Tougaard’s QUASES program for quantitative XPS analysis conducted personally by Professor Tougaard. It will be held in the new Integrated Science Complex, Lorry I. Lokey Laboratory.
Presentations: Dave Castner, University of Washington
Sven Tougaard, University of Southern Denmark
Scott Lea, Pacific Northwest National Laboratory
Don Baer, Pacific Northwest National Laboratory
Andrew Wright, ThermoFisher Scientific
Bill Stickle, Hewlett‐Packard
Location: Surface Analytical Facility
Lorry I. Lokey Laboratories
University of Oregon, Eugene, Oregon
Meals: Morning & afternoon refreshments, Lunch is “on your own”
Contact: Paula Matano